AES

Auger Electron Spectroscopy

Raman

Raman Spectroscopy

EBIC

Electron Beam Induced Current

RBS

Rutherford Backscattering Spectroscopy

EBSD

Electron Backscattered Diffraction

SEM

Scanning Electron Microscopy

EDS

Energy Dispersive X-Ray   Spectroscopy

SIMS

Secondary Ion Mass Spectrometry

FIB

Focused Ion Beam (Single and dual

Beam Imaging)

SPM

Scanning Probe Microscopy

FTIR

Fourier Transform Infrared Spectroscopy

AFM

Atomic Force Microscopy

GC-MS

Gas Chromatography Mass

Spectrometry

TEM

Transmission Electron Microscopy

GDMS

Glow Discharge Mass

Spectrometry

STEM

Scanning Transmission Electron Microscopy

HFS

Hydrogen Forward Spectrometry

TGA-IR/MS

Thermogravimetric Analysis – Infrared

Spectroscopy/Mass Spectroscopy

ICP-OES

Inductively Coupled Plasma Optical

Emission Spectroscopy

DTA

Differential Thermal Analysis

ICP-MS

Inductively Coupled Plasma Mass

Spectrometry

DSC

Differential Scanning Calorimetry

IGA

Instrumental Gas Analysis

TOF-SIMS

Time of Flight Secondary Ion Mass

Spectrometry

LA-ICP-MS

Laser Ablation Inductively Coupled

Plasma Mass Spectrometry

TXRF

Total Reflection X-Ray Fluorescence

Spectroscopy

LEXES

Low Energy X-Ray Emission

Spectroscopy

XPS/ESCA

Spectroscopy for  Chemical Analysis

NRA

Nuclear Reaction Analysis

XRD

X-Ray Diffraction

OP

Optical Profilometry

XRF

X-Ray Fluorescence

PIXE

Particle Induced X-Ray Emission

XRR

X-Ray Reflectivity